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1 article(s) from Laurentie, Jean-Charles

Electrostatic force microscopy for the accurate characterization of interphases in nanocomposites

Diana El Khoury,
Richard Arinero,
Jean-Charles Laurentie,
Mikhaël Bechelany,
Michel Ramonda and
Jérôme Castellon

Beilstein J. Nanotechnol. 2018, 9, 2999–3012, doi:10.3762/bjnano.9.279

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Figure 1: Interphase detection, approach 1: schematic representation of the samples to be compared, and metho...

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Figure 2: Approach 1 (PS + 100 nm Al₂O₃ and PS + 100 nm Al₂O₃ + PVAc samples): (a) average topography profile...

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Figure 3: Interphase detection, approach 2: schematic representation of the samples to be compared, and metho...

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Figure 4: Approach 2: EFM images of PS + 50nmSiO₂ (upper) and PS + 100 nm Al₂O₃ + 50 nm SiO₂ (middle panel) s...

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Figure 5: The three steps of approach 3: compared samples and methodologies.

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Figure 6: Tip calibration using the signal vs z curve. Experimental data fit simulations (tip radius of 29 nm...

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Figure 7: PS calibration – average cross-sectional profiles measured using a typical reference PS sample. (a)...

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Figure 8: Approach 3 (step A) PS + 100 nm Al₂O₃ and PS + 100 nm SiO₂ samples: (a) Average topography profiles...

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Figure 9: Approach 3 (step B) PS + 50 nm Al₂O₃ + 50 nm SiO₂ and PS + 100 nm SiO₂ samples: (a) Average topogra...

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Figure 10: Approach 3 - Step C (PS + 50 nm SiO₂ + 50 nm Al₂O₃ and PS + 100 nm Al₂O₃ samples). a) Average topog...

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Figure 11: Typical simulation of the electric field map obtained with a 2D axisymmetric model of the EFM tip a...

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Published 07 Dec 2018

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